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Specialised microscope systems

Product Introduction

Specialised microscope systems tailored for specific applications, spanning SWIR, differential interference contrast, brightfield metallography, fluorescence, polarisation, and more.

Product Features

  • Specialised design optimised for targeted applications.
  • High-quality optical components
  • Modular configuration for easy expansion
  • Suitable for scientific research and industrial inspection
  • Comprehensive system solution
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Specialised microscope systems

Specialised microscope systems tailored for specific applications, spanning SWIR, differential interference contrast, brightfield metallography, fluorescence, polarisation, and more.

BSM - Short-wave infrared microscope system

The BSM modular SWIR microscope system is a next-generation Short-Wave Infrared imaging platform that extends the imaging range from the traditional v...

Main Features
  • Full coverage of the 900-1700 nm SWIR imaging band
  • Penetrating imaging through silicon-based materials for non-destructive internal inspection
  • Three tube-lens systems available (BSM-T180VA / T090VA / T100VA)
  • Image circle up to 33 mm to support large-format sensors
  • M Plan Apo NIR objective range (5X-50X HR)
  • 0.4 µm ultra-high optical resolution (50X HR objective)
  • Coaxial epi-illumination Köhler lighting system
  • Integrated LED sources at 1200 / 1300 / 1400 / 1550 nm
  • Compatible with high-performance InGaAs cameras (0.33 MP-5.0 MP)
  • Real-time imaging up to 400 fps@640×512
  • TEC cooling ensures low-noise, high-SNR imaging
  • Standard C-mount interface for broad camera compatibility
  • Modular architecture supporting flexible customisation and upgrades
  • Precision CNC machining with anti-vibration design
  • Standard glass optics for optimised cost-effectiveness
Application Fields
Semiconductor inspection Materials analysis Biomedical Research
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DIC100 - Differential interference contrast microscope system

The Differential Interference Contrast (DIC) microscope operates on birefringent double-beam polarisation interference:
1. Linearly polarised light fr...

Standard Working Distance Objective Parameters (45 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
DIC2.5XA 2.5X 0.075 6.2mm 80 mm 4.46µm 10 mm 25 mm M26*0.705
DIC5XA 5X 0.15 23.5mm 39mm 2.2µm 5mm 25 mm M26*0.705
DIC10XA 10X 0.3 22.8mm 20 mm 1.1µm 2.5mm 25 mm M26*0.705
DIC20XA 20X 0.4 19.2mm 10 mm 0.8µm 1.1mm 25 mm M26*0.705
DIC50XA 50X 0.55 11mm 4 mm 0.6µm 0.44mm 25 mm M26*0.705
Long Working Distance Objective Parameters (60 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
DICL2XA 2X 0.055 33.7mm 95 mm 6.1µm 12.5mm 25 mm M26*0.705
DICL5XA 5X 0.14 33.6mm 40 mm 2.2µm 5mm 25 mm M26*0.705
DICL10XA 10X 0.28 33.4mm 20 mm 1.2µm 2.5mm 25 mm M26*0.705
DICL20XA 20X 0.34 29.5mm 10 mm 0.8µm 1.25mm 25 mm M26*0.705
DICL50XA 50X 0.5 18.9mm 4 mm 0.7µm 0.5mm 25 mm M26*0.705
Main Features
  • Standard and long working distance objectives available
  • Imaging path: 1X (tube lens focal length 180 mm) with optional reducers
  • Image circle: 25 mm
  • Spectral range: visible light
  • Camera interfaces: C / M42 / M52 (optional)
  • Illumination: critical illumination or Köhler illumination (optional)
  • Light source: 10 W white LED / blue LED (optional)
Application Fields
Cell biology Materials science Quality control Particle inspection
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BMM100 - Brightfield metallographic microscope system

A brightfield metallographic microscope is a precision optical instrument composed of illumination, imaging, and mechanical subsystems. It is widely a...

Standard Working Distance Objective Parameters (45 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
BF5XA 5X 0.15 22mm 36 mm 2.23µm 5mm 25 mm M20*0.705
BF10XA 10X 0.3 15mm 18mm 1.1µm 2.5mm 25 mm M20*0.705
BF20XA 20X 0.4 10 mm 9mm 0.75µm 1.25mm 25 mm M20*0.705
BF50XA 50X 0.8 2.5mm 3.6mm 0.41µm 0.5mm 25 mm M20*0.705
Long Working Distance Objective Parameters (60 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
BFL2.5XA 2.5X 0.075 6.2mm 80 mm 4.46µm 10 mm 25 mm M26*0.705
BFL5XA 5X 0.15 23.5mm 40 mm 2.2µm 5mm 25 mm M26*0.705
BFL10XA 10X 0.3 22.8mm 20 mm 1.1µm 2.5mm 25 mm M26*0.705
BFL20XA 20X 0.4 19.2mm 10 mm 0.8µm 1.1mm 25 mm M26*0.705
BFL50XA 50X 0.55 11mm 4 mm 0.6µm 0.44mm 25 mm M26*0.705
Main Features
  • Standard or long working-distance objective series (optional)
  • Imaging path: 1X (tube lens focal length 180 mm) with optional custom reducers
  • Image circle: 25 mm
  • Spectral range: visible light
  • Camera interfaces: C / M42 / M52 (optional)
  • Illumination: critical illumination or Köhler illumination (optional)
  • Light source: 10 W white LED / blue LED (optional)
Application Fields
Metal material inspection Metallurgical analysis Industrial quality control Non-Metal Materials Testing
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PLM100 - Professional Polarised Light Imaging Solution

A polarising microscope is designed to study anisotropic transparent or opaque materials. Substances exhibiting birefringence can be clearly distingui...

Standard Working Distance Objective Parameters (45 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
POL2.5XA 2.5X 0.075 6.2mm 80 mm 4.46µm 10 mm 25 mm M26*0.705
POL5XA 5X 0.15 23.5mm 39mm 2.2µm 5mm 25 mm M26*0.705
POL10XA 10X 0.3 22.8mm 20 mm 1.1µm 2.5mm 25 mm M26*0.705
POL20XA 20X 0.4 19.2mm 10 mm 0.8µm 1.1mm 25 mm M26*0.705
POL50XA 50X 0.55 11mm 4 mm 0.6µm 0.44mm 25 mm M26*0.705
Long Working Distance Objective Parameters (60 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
POLL2XA 2X 0.055 33.7mm 95 mm 6.1µm 12.5mm 25 mm M26*0.705
POLL5XA 5X 0.14 33.6mm 40 mm 2.2µm 5mm 25 mm M26*0.705
POLL10XA 10X 0.28 33.4mm 20 mm 1.2µm 2.5mm 25 mm M26*0.705
POLL20XA 20X 0.34 29.5mm 10 mm 0.8µm 1.25mm 25 mm M26*0.705
POLL50XA 50X 0.5 18.9mm 4 mm 0.7µm 0.5mm 25 mm M26*0.705
Main Features
  • Standard and long working distance objectives available
  • Imaging path: 1X (tube lens focal length 180 mm) with optional reducers
  • Image circle: 25 mm
  • Spectral range: visible light
  • Camera interfaces: C / M42 / M52 (optional)
  • Illumination: critical illumination or Köhler illumination (optional)
  • Light source: 10 W white LED / blue LED (optional)
Application Fields
Geological research Materials science Crystallography analysis Stress birefringence inspection
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FM100 - Fluorescence microscope system

A fluorescence microscope observes fluorescent or phosphorescent specimens. Excitation light of a specific wavelength (or band) illuminates the sample...

Standard Working Distance Objective Parameters (45 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
Flour2.5XA 2.5X 0.075 6.2mm 80 mm 4.46µm 10 mm 25 mm M26*0.705
Flour5XA 5X 0.15 23.5mm 39mm 2.2µm 5mm 25 mm M26*0.705
Flour10XA 10X 0.3 22.8mm 20 mm 1.1µm 2.5mm 25 mm M26*0.705
Flour20XA 20X 0.4 19.2mm 10 mm 0.8µm 1.1mm 25 mm M26*0.705
Flour50XA 50X 0.55 11mm 4 mm 0.6µm 0.44mm 25 mm M26*0.705
Long Working Distance Objective Parameters (60 mm parfocal distance)
Objective Name Magnification Numerical Aperture Working Distance Focal Length Resolution Object Field Image Field Thread Size
FlourL2XA 2X 0.055 33.7mm 95 mm 6.1µm 12.5mm 25 mm M26*0.705
FlourL5XA 5X 0.14 33.6mm 40 mm 2.2µm 5mm 25 mm M26*0.705
FlourL10XA 10X 0.28 33.4mm 20 mm 1.2µm 2.5mm 25 mm M26*0.705
FlourL20XA 20X 0.34 29.5mm 10 mm 0.8µm 1.25mm 25 mm M26*0.705
FlourL50XA 50X 0.5 18.9mm 4 mm 0.7µm 0.5mm 25 mm M26*0.705
Main Features
  • Standard and long working distance objectives available
  • Imaging path: 1X (tube lens focal length 180 mm) with optional reducers
  • Image circle: 25 mm
  • Spectral range: visible light
  • Camera interfaces: C / M42 / M52 (optional)
  • Illumination: critical illumination or Köhler illumination (optional)
  • Illumination source: 3 W, 365 nm LED
  • Fluorescence module: DAPI single-band UV filter set (365 nm excitation, 445 nm emission, 405 nm dichroic mirror), customisable
Application Fields
Biomedical Research Fluorescent labelling detection Cell imaging Bleaching agent detection in papermaking
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Special Microscopy System Features

  • Specialised design optimised for targeted applications.
  • High-quality optical components
  • Modular configuration for easy expansion
  • Suitable for scientific research and industrial inspection
  • Comprehensive system solution
Selection Guide
Microscopy Technology
Choose the appropriate microscopy method based on sample characteristics
Objective Configuration
Standard or long working distance objectives meet different needs
Illumination System
Köhler or critical illumination available
Camera Interface
Supports C/M42/M52 and various interfaces

Topograph Photoelectric special microscopy systems adopt modular design, providing specialized solutions for different application scenarios to meet the high-end requirements of research and industrial inspection.

System Configuration Solutions

Flexibly combine hardware and software modules based on application requirements

Dimension Key Configuration Technical Highlights User Benefits
Imaging Hardware • ToupCam X Series: IMX415/IMX571 BSI CMOS, up to 45 MP, USB 3.0/HDMI 60 fps 4K
• HCAM/PUM Portable Module: UVC plug-and-play, 8 LED ring light built-in 		• Low read noise & 66 dB+ dynamic range
• Progressive scan + global shutter optional 		True color reproduction, high contrast; meets high-speed AOI, fluorescence weak signal and multi-scenario needs
Zoom Optics • MZO Series (0.25×–8×): 20× zoom ratio, NA 0.12, 174 mm long working distance
• ZOPE All-in-one: Built-in 8 LED & USB camera, parfocal linear zoom 		Dual-end parallel optical path, diffraction-limited MTF, low distortion Zoom without refocusing, view samples from millimeter to micrometer scale
Illumination System • TZM0756DRL 65/85 mm LED ring light: PWM continuously adjustable brightness
• TZM0756CL coaxial light + point source
• AALRL-200 large ring light: 300 mm uniform field 		Multi-channel/polarization/coaxial composite light; LED angle 30° adjustable Solves PCB solder joint glare, wafer scratches, transparent film inspection challenges
Mechanical Platform • TPS-600 coarse/fine adjustment stand (5 kg load capacity)
• TPS-300 precision fine adjustment 2 µm step
• Motorized Z & XY platform (optional) 		Anodized Class II aerospace aluminum, ball screw Long-term 24×7 stable positioning, supports autofocus and array scanning
Software & Algorithm • ToupView: Real-time measurement/annotation, deep focus synthesis, HDR, polarization demodulation
• SDK/API: Windows/macOS/Linux/Android
• AI Module: Defect classification, dimension tolerance judgment 		Secondary development + PLC/robot serial protocol Quick integration into MES/SPC quality systems, supports edge computing and cloud synchronization

System Advantages

Five core advantages building a professional microscopy imaging platform

Complete Ecosystem, Turnkey Delivery

All self-developed cameras, lenses, lighting, stands, and software — no multi-vendor procurement matching needed, plug-and-play saves 60% integration time.

High Resolution + Large Depth of Field

45 MP ultra-high definition CMOS + deep focus synthesis algorithm achieves micrometer-level depth clarity within a 30 mm field of view.

Multi-spectral & Low Light Imaging

Supports white light/near-infrared/polarization combination with coaxial + ring light synchronous exposure; reveals texture details even at 0.05 lux.

Flexible Expansion, Investment Protection

Standard C-Mount and GigE Vision/USB3 Vision protocols allow later upgrades to AI modules, motorized stages, and multi-camera synchronization without replacing the main unit.

Cross-Industry Implementation Cases

  • Semiconductor: Bumping, scratch, wire bond defect AOI
  • FPC/PCB: Solder paste height, pad residue detection
  • New Energy: Lithium battery separator pore size, electrode coating consistency
  • Life Sciences: Tissue sections, entomology, live plant observation
  • Education & Training: University material science virtual experiments, STEAM maker courses

Application Cases

Successful implementation experience across multiple industries

Semiconductor Inspection

Bumping, scratch, wire bond defect automatic optical inspection

Semiconductor Manufacturing
PCB Inspection

High-precision solder paste height and pad residue detection

FPC/PCB Quality Control
New Energy Inspection

Lithium battery separator pore size and electrode coating consistency analysis

New Energy Materials
Life Sciences

Tissue sections, live cell dynamic observation

Life Sciences Research