BMM100 Series - Brightfield metallographic microscope system

Product Introduction

A brightfield metallographic microscope is a precision optical instrument composed of illumination, imaging, and mechanical subsystems. It is widely applied across modern science and technology and serves as a critical inspection tool. Metallographic microscopes play an increasingly important role in biology, geology, mining, medicine, and related disciplines.

Technical Features

Standard or long working-distance objective series (optional)
Imaging path: 1X (tube lens focal length 180 mm) with optional custom reducers
Image circle: 25 mm
Spectral range: visible light
Camera interfaces: C / M42 / M52 (optional)
Illumination: critical illumination or Köhler illumination (optional)
Light source: 10 W white LED / blue LED (optional)

Application Fields

Metal material inspection Metallurgical analysis Industrial quality control Non-Metal Materials Testing

Product Details

Basic Technical Parameters

Optical System Parameters
Objective Series Standard Working Distance Series / Long Working Distance Series (Optional)
Imaging Optical Path 1X (Tube lens focal length 180 mm), customizable reduction lenses available
Image Plane Size 25 mm
Spectral Range Visible Light
Camera Interface C/M42/M52 options available
Illumination System Parameters
Illumination Method Critical illumination/Kohler illumination options available
Light Source 10W white light/blue light LED illumination options available

Objective Parameters Table

Standard Working Distance Series

Model Magnification Numerical Aperture (NA) Working Distance (WD) Focal Length Resolution Object Field Image Field Thread
BF5XA 5X 0.15 22mm 36 mm 2.23µm 5mm 25 mm M20*0.705
BF10XA 10X 0.3 15mm 18mm 1.1µm 2.5mm 25 mm M20*0.705
BF20XA 20X 0.4 10 mm 9mm 0.75µm 1.25mm 25 mm M20*0.705
BF50XA 50X 0.8 2.5mm 3.6mm 0.41µm 0.5mm 25 mm M20*0.705

Long Working Distance Series

Model Magnification Numerical Aperture (NA) Working Distance (WD) Focal Length Resolution Object Field Image Field Thread
BFL2.5XA 2.5X 0.075 6.2mm 80 mm 4.46µm 10 mm 25 mm M26*0.705
BFL5XA 5X 0.15 23.5mm 40 mm 2.2µm 5mm 25 mm M26*0.705
BFL10XA 10X 0.3 22.8mm 20 mm 1.1µm 2.5mm 25 mm M26*0.705
BFL20XA 20X 0.4 19.2mm 10 mm 0.8µm 1.1mm 25 mm M26*0.705
BFL50XA 50X 0.55 11mm 4 mm 0.6µm 0.44mm 25 mm M26*0.705

Product Dimensional Drawing

BMM100 Series Dimensional Drawing

System Configuration Solutions

Flexible combination of hardware and software modules based on application requirements

Dimension Key Configuration Technical Highlights User Benefits
Imaging Hardware • ToupCam X Series: IMX415/IMX571 back-illuminated CMOS, up to 45 MP, USB 3.0/HDMI 60 fps 4K
• HCAM/PUM Portable Module: UVC plug-and-play, built-in 8 LED ring light
• Low read noise & 66 dB+ dynamic range
• Progressive scan + optional global shutter
True color reproduction, high contrast; suitable for high-speed AOI, fluorescence weak signal detection and multiple scenarios
Zoom Optics • MZO Series (0.25×–8×): 20× zoom ratio, NA 0.12, 174 mm long working distance
• ZOPE Integrated System: Built-in 8 LED & USB camera, parfocal linear zoom
Dual-ended parallel optical path, diffraction-limited MTF, low distortion Zooming without refocusing, transitioning samples from millimeter to micrometer scale
Illumination System • TZM0756DRL 65/85 mm LED ring light: PWM continuously adjustable brightness
• TZM0756CL coaxial light + point light source
• AALRL-200 large ring light: 300 mm uniform field of view
Multi-channel/polarized/coaxial composite light; LED angle 30° adjustable Solving PCB solder joint glare, wafer scratches, transparent film inspection and other challenges
Mechanical Platform • TPS-600 coarse and fine adjustment stand (5 kg load capacity)
• TPS-300 precision fine adjustment 2 µm step
• Motorized Z & XY platforms (optional)
Anodized Class II aerospace aluminum, ball screw Long-term 24×7 stable positioning, supporting autofocus and array scanning
Software & Algorithms • ToupView: Real-time measurement/annotation, depth compositing, HDR, polarization demodulation
• SDK/API: Windows/macOS/Linux/Android
• AI Module: Defect classification, dimensional tolerance determination
Secondary development + PLC/robot serial protocols Rapid integration into MES/SPC quality systems, supporting edge computing and cloud synchronization

System Advantages

Five core advantages building professional microscopy imaging platforms

Complete Ecosystem, Turnkey Delivery

Cameras, lenses, illumination, stands, and software all developed in-house. No need for multi-vendor procurement coordination, plug-and-play saves 60% integration time.

High Resolution + Large Depth of Field

45 MP ultra-clear CMOS + depth compositing algorithms provide micrometer-level depth-clear images within 30 mm field of view.

Multi-band & Low-Light Imaging

Supports white light, near-infrared, and polarization combinations with synchronized exposure of coaxial and ring lights; presents texture details even at 0.05 lux.

Flexible Expansion, Investment Protection

Standard C-Mount and GigE Vision/USB3 Vision protocols enable later upgrades to AI modules, automated stages, and multi-camera synchronization without replacing the main system.

Cross-Industry Implementation Cases

Semiconductor: Bumping, scratches, bonding wire defect AOI
FPC/PCB: Solder paste height, pad residue detection
New Energy: Lithium battery separator pore size, electrode coating consistency
Life Sciences: Tissue sections, entomology, live plant observation
Education: University materials virtual experiments, STEAM maker courses

Application Cases

Successful implementation experience across multiple industries

Semiconductor Inspection

Bumping, scratches, bonding wire defect automated optical inspection

Semiconductor Manufacturing
PCB Inspection

High-precision detection of solder paste height and pad residue

FPC/PCB Quality Control
New Energy Detection

Lithium battery separator pore analysis, electrode coating consistency analysis

New Energy Materials
Life Sciences

Tissue sections, live cell dynamic observation

Life Sciences Research