BMM 100 Series Brightfield Metallographic Microscope System

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Introduction

BMM 100 Series Brightfield Metallographic Microscope System

The brightfield metallographic microscope is mainly composed of three systems: the illumination system, imaging system, and mechanical system. It is a precision optical instrument widely used in various fields of modern science and technology, serving as an extremely important inspection tool. In particular, in fields such as biology, geology, mineral resources, and medicine, the metallographic microscope plays an increasingly important role.

Key Features of the BMM100 Series Brightfield Metallographic Microscope System:

  • Standard working distance series / long working distance series objectives (optional);
  • Imaging optical path: 1X (tube lens focal length 180mm), with the option to customize reduction lenses for different magnifications;
  • Image plane size: 25mm;
  • Imaging optical path spectral range: Visible light;
  • Camera interface options: C/M42/M52, etc. (optional);
  • Illumination options: Critical illumination / Köhler illumination (optional);
  • Light source: 10W white/blue LED illumination (optional);

System Parameters

Standard Working Distance Objective Parameters (45mm parfocal)

Order code

Magnification

NA

WD/mm

Focal length(mm)

Resolution(um)

OFOV(mm)

IFOV(mm)

Thread

BF2.5XA

2.5X

0.075

6.2

80

4.46

10

25

M26*0.705

BF5XA

5X

0.15

23.5

39

2.2

5

25

M26*0.705

BF10XA

10X

0.30

22.8

20

1.1

2.5

25

M26*0.705

BF20XA

20X

0.40

19.2

10

0.8

1.1

25

M26*0.705

BF50XA

50X

0.55

11

4

0.6

0.44

25

M26*0.705

Long Working Distance Objective Parameters (60mm parfocal)

Order code

Magnification

NA

WD/mm

Focal length(mm)

Resolution(um)

OFOV(mm)

IFOV(mm)

Thread

BFL2XA

2X

0.055

33.7

100

6.1

12.5

25

M26*0.705

BFL5XA

5X

0.14

33.6

40

2.2

5

25

M26*0.705

BFL10XA

10X

0.28

33.4

20

1.2

2.5

25

M26*0.705

BFL20XA

20X

0.34

29.5

10

0.8

1.25

25

M26*0.705

BFL50XA

50X

0.5

18.9

4

0.7

0.5

25

M26*0.705

Application Areas

Inspection of Metal and Alloy Materials

The image below shows an LCD display captured using the BMM100 series brightfield metallographic microscope system.

LCD screen captured by the BMM100 series microscope system (left) and LCD panel flex cable (right)
BMM100 Series BMM100 Series

The image below shows a metal surface captured using the BMM100 series brightfield metallographic microscope system.

Metal surface captured by the BMM100 series microscope system
BMM100 Series BMM100 Series

Non-metal Material Inspection

The image below shows a plastic surface captured using the BMM100 series brightfield metallographic microscope system.

The left image shows details—such as fine structures or defects—that are not visible or barely visible under a conventional metallurgical microscope in bright field illumination, while the BMM100 series system easily reveals these details. Additionally, the BMM100 system can detect micro-particles, pores, cracks, and uneven contours, thereby enhancing the reliability of material analysis.