SWIR2048L3A-CL80K Short-Wave Infrared Camera

Product Introduction

The SWIR2048L3A-CL80K is a China-made InGaAs SWIR line-scan camera for high-speed online inspection and short-wave infrared sorting. It uses a 2048-pixel line-scan architecture with 900–1700 nm spectral response, reaches 79K @ 2048 × 1 through CameraLink Full, and combines a 512 MByte memory buffer, 14-bit ADC, and TEC cooling up to 40 °C below ambient for stable industrial imaging.

Key Features

  • 2048-pixel China-made InGaAs line-scan sensor
  • 900–1700 nm spectral response
  • 79K @ 2048 × 1 high-speed line-scan imaging
  • 70% quantum efficiency @ 1550 nm
  • 14-bit ADC and 512 MByte memory buffer
  • CameraLink Full interface
  • Global shutter design
  • Cooling up to 40 °C below ambient
  • M42 lens mount
  • SDK and CLView software support

Product Details

Specifications
Model SWIR2048L3A-CL80K
Sensor China-made 2048-pixel line-scan sensor
Sensor Type InGaAs short-wave infrared (SWIR) line-scan image sensor
Shutter Type Global Shutter
Color Type Monochrome
Resolution 2048 pixels (2048 × 1)
Sensor Size 25.6 mm
Pixel Size 12.5 µm × 12.5 µm
Spectral Range 900–1700 nm
Performance Specifications
Frame Rate 79K @ 2048 × 1
ADC 14 bit
Memory 512 MByte
Quantum Efficiency 70% @ 1550 nm
Conversion Gain 6.1 e-/ADU (GAIN = 1)
Dynamic Range 64.1 dB (GAIN = 1)
Readout Noise 60.4 e- (GAIN = 1)
Full Well Capacity 96.4 ke- (GAIN = 1)
Maximum SNR 49.8 dB (GAIN = 1)
Exposure Time Range 1 µs - 1 s
Interface Specifications
Digital I/O 1 optocoupler-isolated input, 1 optocoupler-isolated output
Lens Mount M42
Data Interface CameraLink Full
Data Format Mono 14
Cooling Capacity 40 °C below ambient temperature
Power Supply DC 12 V
Software SDK development kit and CLView software based on Delsa frame grabber
Physical & Environmental Specifications
Dimensions 68 mm × 68 mm × 90.3 mm
Weight 485 g
Power Consumption TBD
Operating Temperature Working temperature: -40 °C to 70 °C
Operating Humidity 20% to 80%, non-condensing
Storage Temperature Storage temperature: -40 °C to 70 °C
Operating System / Driver SDK development kit and CLView software based on Delsa frame grabber
Certification CE, FCC

Product Overview

SWIR2048L3A-CL80K is a China-made InGaAs SWIR line-scan camera engineered for high-speed online inspection, material sorting, spectral sorting, and continuous-web imaging. It combines a 2048-pixel line-scan sensor, CameraLink Full transport, and TEC cooling to deliver stable short-wave infrared imaging in demanding industrial workflows.

  • SWIR spectral response: covers 900–1700 nm for moisture analysis, material identification, and short-wave infrared process inspection.
  • High-speed line-scan acquisition: supports 79K @ 2048 × 1 to match continuous motion targets and inline inspection systems.
  • Stable signal chain: combines 14 bit ADC, 512 MByte memory, and Mono 14 output for reliable industrial data capture.
  • TEC cooling control: 40 °C below ambient temperature helps improve imaging stability and dark-noise control during long-duty operation.
  • Industrial system integration: CameraLink Full, 1 optocoupler-isolated input, 1 optocoupler-isolated output, and an M42 mount simplify integration into line-scan optical systems.
  • Software support: the camera is supplied with SDK development kit and CLView software based on Delsa frame grabber for configuration, acquisition, and secondary development.

Core Performance Highlights

Line Rate

79K @ 2048 × 1

Quantum Efficiency

70% @ 1550 nm

Interface

CameraLink Full

Product Summary

SWIR2048L3A-CL80K is optimized for high-speed SWIR line-scan applications where stable CameraLink transmission, short-wave infrared sensitivity, and dependable industrial integration matter most.

SWIR2048L3A-CL80K Product Manual

PDF format with detailed technical specifications and outline information


SDK and CLView Software

Development kit and CameraLink acquisition software for system integration


3D Model Files

STEP files for mechanical integration and enclosure design

Quantum Efficiency Curve #

SWIR2048L3A-CL80K typical quantum efficiency response across 900–1700 nm

SWIR2048L3A-CL80K 900–1700 nm quantum efficiency curve
SWIR2048L3A-CL80K (900–1700 nm) QE curve for reference.

Product Dimensions #

SWIR2048L3A-CL80K outline drawing

SWIR2048L3A-CL80K dimension drawing
CameraLink line-scan camera dimensions
Cooled 68 mm × 68 mm × 90.3 mm
Applicable model: SWIR2048L3A-CL80K

Series Highlights#

Designed around high-speed line-scan inspection, SWIR sensitivity, and stable CameraLink integration

High-Speed Line Rate

The 2048-pixel line-scan architecture and 79K @ 2048 × 1 output are intended for real-time scanning of continuously moving targets and online production lines.

SWIR Material Discrimination

The 900–1700 nm response band is well suited to moisture analysis, material sorting, silicon inspection, and other short-wave infrared recognition tasks.

Industrial Integration

CameraLink Full, isolated trigger I/O, an M42 mount, and the supplied SDK and CLView software make it easier to integrate into dedicated line-scan inspection systems.

Frequently Asked Questions

Learn more about SWIR short-wave infrared camera technology

Electromagnetic spectrum diagram: UV 200–380 nm, Visible light 380–750 nm, Near infrared 750–1100 nm, Short-wave infrared 1100–2500 nm, Long-wave infrared 8000–14000 nm
A SWIR camera is a professional imaging device that operates in the short-wave infrared spectrum (approximately 400–1700 nanometers). It can achieve imaging effects that go beyond visible light but differ from thermal imaging cameras (LWIR), making it widely applicable in scenarios requiring high standards for materials, structures, and details.

SWIR cameras have wide applications including industrial inspection, machine vision, material sorting, food testing, scientific research, medical diagnostics, security monitoring, process control, and transportation. They are particularly outstanding in material analysis, moisture detection, penetration through fog/smoke/dust, and night surveillance.

Yes! SWIR cameras can see through certain materials that are opaque to visible light, such as certain plastics and silicon wafers. This capability is extremely valuable for semiconductor inspection, material testing, and other industries.

SWIR cameras primarily capture reflected or emitted light in the short-wave infrared range, unlike thermal imaging cameras (LWIR) which rely on thermal radiation from objects. SWIR cameras have lower thermal sensitivity than thermal imaging cameras and are better suited for structural analysis and material identification rather than direct temperature detection.

Theoretically, yes. SWIR cameras can identify objects or components that cannot be distinguished in visible light through differences in reflection and transmission of materials under short-wave infrared light. They are widely used in security screening, industrial sorting, and inspection applications.

Deep Understanding of SWIR Cameras

Short-Wave Infrared (SWIR) cameras and their core sensors are important components of advanced imaging systems. SWIR technology covers the 900–1700 nanometer wavelength band and has excellent penetration capabilities in harsh environments, such as penetrating fog, smoke, and dust to achieve clear imaging under extreme conditions.

SWIR cameras primarily rely on short-wave infrared light reflection, similar to the visible light band, complementing the application range that thermal imaging cameras (LWIR) cannot cover, providing more complete imaging solutions. They are compact and flexibly integrated, making them easy to apply in various industrial and commercial systems.

The high resolution and high sensitivity of SWIR cameras can meet precision detection and high-requirement applications, capable of detecting minute changes and anomalies in samples, making them very suitable for quality control and defect detection. Some models support cooling, further ensuring imaging quality in high-temperature or high-noise environments.

To reduce system costs and improve integration efficiency, modern SWIR cameras commonly adopt standard optical interfaces and compact designs to accommodate broader application requirements. With the continuous development of imaging markets and technology, SWIR cameras have become one of the key technologies for high-end imaging and sensing in multiple industries due to their unique advantages.

Application Examples

Demonstration of SWIR camera applications in real-world scenarios

More Application Industry References

  • Semiconductor Industry: Solar cell and chip inspection
  • Agriculture: Spectral remote sensing applications via multirotor aircraft
  • Recycling Industry: Material sorting of plastics, waste, and other materials
  • Medical Imaging and Research: Hyperspectral and multispectral imaging
  • Food Industry: Quality inspection and grading
  • Beverage Industry: Liquid level detection in opaque containers
  • Packaging: Seal inspection
  • Glass Industry: High-temperature glass penetration defect detection
  • Printing Industry: See-through hidden features
  • Video Surveillance: Visual enhancement (e.g., smoke penetration)
  • Security: Counterfeit detection, such as currency, wigs, or skin