PLM100 Series Polarizing Light Microscopy System

Product Introduction

The Polarizing Light Microscope is a microscope used for studying both transparent and opaque anisotropic materials. Any material with birefringence can be clearly distinguished under a polarizing microscope. While some of these materials can also be observed using staining methods, others cannot and must utilize a polarizing microscope. The reflected light polarizing microscope is an essential instrument for studying and identifying birefringent materials using the polarization properties of light.

Product Features

  • Standard/Long working distance objective series (optional)
  • Imaging optical path: 1X (tube lens focal length 180 mm), customizable with different magnification reducers
  • Imaging path image field size: 25 mm
  • Imaging path spectral range: Visible light
  • Camera interface: C/M42/M52 optional
  • Illumination method: Critical/Köhler illumination optional
  • Illumination source: 10 W white/blue LED illumination optional

System Configuration and Parameters

Professional polarized light microscope system providing precise solutions for anisotropic material analysis

System Operating Principle

The PLM100 Series polarizing microscopy system utilizes the polarization properties of light to observe and analyze materials with birefringent properties through the coordination of polarizer and analyzer

Step 1
Polarizer

Converts natural light to linearly polarized light, positioned in the illumination path to provide polarized illumination for the sample

Step 2
Sample Interaction

Birefringent materials decompose polarized light into two beams with perpendicular vibration directions and different propagation speeds, creating optical path differences

Step 3
Analyzer

Positioned at 90 degrees orthogonal to the polarizer, analyzes the polarization state of light after passing through the sample, forming interference images

Step 4
Imaging System

Magnifies and transmits the interference image to the camera or eyepiece, revealing the material's anisotropic characteristics and stress distribution

Objective Series Parameters

Standard Working Distance Objective Series (45 mm parfocal distance, 200 mm tube lens focal length )
Model Magnification Numerical Aperture (NA) Working Distance Focal Length Resolution Object Field Image Field
POL2.5XA 2.5X 0.075 6.2 mm 80 mm 4.46 µm 10 mm 25 mm
POL5XA 5X 0.15 23.5 mm 39 mm 2.2 µm 5 mm 25 mm
POL10XA 10X 0.3 22.8 mm 20 mm 1.1 µm 2.5 mm 25 mm
POL20XA 20X 0.4 19.2 mm 10 mm 0.8 µm 1.1 mm 25 mm
POL50XA 50X 0.55 11 mm 4 mm 0.6 µm 0.44 mm 25 mm
Long Working Distance Objective Series (60 mm parfocal distance, 200 mm tube lens focal length )
Model Magnification Numerical Aperture (NA) Working Distance Focal Length Resolution Object Field Image Field
POLL2XA 2X 0.055 33.7 mm 100 mm 6.1 µm 12.5 mm 25 mm
POLL5XA 5X 0.14 33.6 mm 40 mm 2.2 µm 5 mm 25 mm
POLL10XA 10X 0.28 33.4 mm 20 mm 1.2 µm 2.5 mm 25 mm
POLL20XA 20X 0.34 29.5 mm 10 mm 0.8 µm 1.25 mm 25 mm
POLL50XA 50X 0.5 18.9 mm 4 mm 0.7 µm 0.5 mm 25 mm

System Technical Specifications

Optical System
Imaging Path
1X (tube lens focal length 180 mm), customizable with different magnification reducers
Image Size
25 mm
Spectral Range
Visible light
Tube Lens Focal
200 mm
Illumination System
Illumination Type
Critical/Köhler illumination optional
Light Source
10 W LED
Light Options
White LED/Blue LED optional
Polarization System
Camera Interface
C/M42/M52 optional
Objective Thread
M26×0.705
Polarization Config
Polarizer + Analyzer (90° orthogonal)

Typical Application Cases

Professional applications of PLM100 system across various fields

Geology, Petrology, and Mineral Analysis

The PLM100 Series plays a central role in geological research, enabling precise analysis of crystal structures and mineral composition. The system is particularly suitable for characteristic analysis of metal ores (oxides, sulfides, silicates), as well as asbestos fiber detection and coal petrology component analysis.

  • Accurate identification of mineral species and crystal structures
  • Analysis of ore composition characteristics
  • Quantitative asbestos fiber detection
  • Coal component analysis
  • Crystal optical property determination

Material Stress Birefringence Detection

The system precisely detects stress distribution in glass, plastic, and polymer materials. Through the photoelastic effect, internal material stress is visualized as interference color patterns, providing critical data for product quality control and failure analysis.

  • Non-destructive stress detection
  • Visualized stress distribution mapping
  • Identification of stress concentration areas
  • Evaluation of glass inclusions
  • Quality control for plastic injection molding

Specific Application Cases

  • Internal stress detection in glass products
  • Edge stress analysis in plastic housings
  • Uniformity evaluation of polymer films
  • Defect identification in composite materials

More Application Fields

Textile and Fiber Inspection

The PLM100 Series has important application value in textile industry quality control, accurately identifying fiber types, evaluating fiber orientation, analyzing fabric structure, and providing scientific basis for textile composition analysis and quality assessment.

  • Differentiation between natural and synthetic fibers
  • Quantitative analysis of fiber orientation
  • Fabric structure characterization

Comparison with Other Microscopy Techniques

Comparison Technique PLM100 System Advantages
Brightfield Metallographic Microscopy PLM100 can observe stress birefringence phenomena undetectable by brightfield microscopy, providing internal material stress information
Conventional Optical Microscopy PLM100 reveals material anisotropic characteristics through polarized light technology, providing crystallography and stress analysis capabilities
Fluorescence Microscopy PLM100 requires no staining treatment, directly observes intrinsic optical properties, with simple operation that doesn't alter sample properties

System Configuration and Accessories

Standard Configuration
  • PLM100 main system
  • Polarizer module
  • Analyzer module
  • 10 W LED illumination system
  • Standard C-mount adapter
Optional Accessories
  • Standard working distance objective series (2.5X-50X)
  • Long working distance objective series (2X-50X)
  • M42/M52 camera adapters
  • Magnification reducer system
  • Critical/Köhler illumination modules
  • White/Blue LED light sources
  • Compensator kit
  • Rotating specimen stage

The PLM100 series features a modular design that can be flexibly configured according to specific analysis requirements

PLM100 System Advantages

Professional polarized light microscopy technology revealing material anisotropic characteristics

Crystal Structure Analysis

Accurately identify mineral crystal types, analyze crystal optical properties, providing reliable data for geological research.

Stress Birefringence Detection

Non-destructive detection of internal stress distribution in materials, achieving stress visualization through photoelastic effects.

Fiber Material Identification

Accurately identify natural and synthetic fibers, assess fiber orientation, supporting textile quality control.

High Extinction Ratio Design

Professional polarizing objectives eliminate internal stress interference, ensuring polarized imaging quality and measurement accuracy.

No Sample Treatment Required

Directly observe material intrinsic optical properties without staining or special preparation, maintaining sample original state.

Quantitative Analysis Capability

Combined with compensators for optical path difference measurements, enabling quantitative analysis of material thickness and birefringence.