PLM100 Series Polarizing Light Microscopy System
Product Introduction
The Polarizing Light Microscope is a microscope used for studying both transparent and opaque anisotropic materials. Any material with birefringence can be clearly distinguished under a polarizing microscope. While some of these materials can also be observed using staining methods, others cannot and must utilize a polarizing microscope. The reflected light polarizing microscope is an essential instrument for studying and identifying birefringent materials using the polarization properties of light.
Product Features
- Standard/Long working distance objective series (optional)
- Imaging optical path: 1X (tube lens focal length 180 mm), customizable with different magnification reducers
- Imaging path image field size: 25 mm
- Imaging path spectral range: Visible light
- Camera interface: C/M42/M52 optional
- Illumination method: Critical/Köhler illumination optional
- Illumination source: 10 W white/blue LED illumination optional
System Configuration and Parameters
Professional polarized light microscope system providing precise solutions for anisotropic material analysis
System Operating Principle
The PLM100 Series polarizing microscopy system utilizes the polarization properties of light to observe and analyze materials with birefringent properties through the coordination of polarizer and analyzer
Polarizer
Converts natural light to linearly polarized light, positioned in the illumination path to provide polarized illumination for the sample
Sample Interaction
Birefringent materials decompose polarized light into two beams with perpendicular vibration directions and different propagation speeds, creating optical path differences
Analyzer
Positioned at 90 degrees orthogonal to the polarizer, analyzes the polarization state of light after passing through the sample, forming interference images
Imaging System
Magnifies and transmits the interference image to the camera or eyepiece, revealing the material's anisotropic characteristics and stress distribution
Objective Series Parameters
Standard Working Distance Objective Series (45 mm parfocal distance, 200 mm tube lens focal length )
Model | Magnification | Numerical Aperture (NA) | Working Distance | Focal Length | Resolution | Object Field | Image Field |
---|---|---|---|---|---|---|---|
POL2.5XA | 2.5X | 0.075 | 6.2 mm | 80 mm | 4.46 µm | 10 mm | 25 mm |
POL5XA | 5X | 0.15 | 23.5 mm | 39 mm | 2.2 µm | 5 mm | 25 mm |
POL10XA | 10X | 0.3 | 22.8 mm | 20 mm | 1.1 µm | 2.5 mm | 25 mm |
POL20XA | 20X | 0.4 | 19.2 mm | 10 mm | 0.8 µm | 1.1 mm | 25 mm |
POL50XA | 50X | 0.55 | 11 mm | 4 mm | 0.6 µm | 0.44 mm | 25 mm |
Long Working Distance Objective Series (60 mm parfocal distance, 200 mm tube lens focal length )
Model | Magnification | Numerical Aperture (NA) | Working Distance | Focal Length | Resolution | Object Field | Image Field |
---|---|---|---|---|---|---|---|
POLL2XA | 2X | 0.055 | 33.7 mm | 100 mm | 6.1 µm | 12.5 mm | 25 mm |
POLL5XA | 5X | 0.14 | 33.6 mm | 40 mm | 2.2 µm | 5 mm | 25 mm |
POLL10XA | 10X | 0.28 | 33.4 mm | 20 mm | 1.2 µm | 2.5 mm | 25 mm |
POLL20XA | 20X | 0.34 | 29.5 mm | 10 mm | 0.8 µm | 1.25 mm | 25 mm |
POLL50XA | 50X | 0.5 | 18.9 mm | 4 mm | 0.7 µm | 0.5 mm | 25 mm |
System Technical Specifications
Optical System
- Imaging Path
- 1X (tube lens focal length 180 mm), customizable with different magnification reducers
- Image Size
- 25 mm
- Spectral Range
- Visible light
- Tube Lens Focal
- 200 mm
Illumination System
- Illumination Type
- Critical/Köhler illumination optional
- Light Source
- 10 W LED
- Light Options
- White LED/Blue LED optional
Polarization System
- Camera Interface
- C/M42/M52 optional
- Objective Thread
- M26×0.705
- Polarization Config
- Polarizer + Analyzer (90° orthogonal)
Typical Application Cases
Professional applications of PLM100 system across various fields
Geology, Petrology, and Mineral Analysis
The PLM100 Series plays a central role in geological research, enabling precise analysis of crystal structures and mineral composition. The system is particularly suitable for characteristic analysis of metal ores (oxides, sulfides, silicates), as well as asbestos fiber detection and coal petrology component analysis.
- Accurate identification of mineral species and crystal structures
- Analysis of ore composition characteristics
- Quantitative asbestos fiber detection
- Coal component analysis
- Crystal optical property determination
Material Stress Birefringence Detection
The system precisely detects stress distribution in glass, plastic, and polymer materials. Through the photoelastic effect, internal material stress is visualized as interference color patterns, providing critical data for product quality control and failure analysis.
- Non-destructive stress detection
- Visualized stress distribution mapping
- Identification of stress concentration areas
- Evaluation of glass inclusions
- Quality control for plastic injection molding
Specific Application Cases
- Internal stress detection in glass products
- Edge stress analysis in plastic housings
- Uniformity evaluation of polymer films
- Defect identification in composite materials
More Application Fields
Textile and Fiber Inspection
The PLM100 Series has important application value in textile industry quality control, accurately identifying fiber types, evaluating fiber orientation, analyzing fabric structure, and providing scientific basis for textile composition analysis and quality assessment.
- Differentiation between natural and synthetic fibers
- Quantitative analysis of fiber orientation
- Fabric structure characterization
Comparison with Other Microscopy Techniques
Comparison Technique | PLM100 System Advantages |
---|---|
Brightfield Metallographic Microscopy | PLM100 can observe stress birefringence phenomena undetectable by brightfield microscopy, providing internal material stress information |
Conventional Optical Microscopy | PLM100 reveals material anisotropic characteristics through polarized light technology, providing crystallography and stress analysis capabilities |
Fluorescence Microscopy | PLM100 requires no staining treatment, directly observes intrinsic optical properties, with simple operation that doesn't alter sample properties |
System Configuration and Accessories
Standard Configuration
- PLM100 main system
- Polarizer module
- Analyzer module
- 10 W LED illumination system
- Standard C-mount adapter
Optional Accessories
- Standard working distance objective series (2.5X-50X)
- Long working distance objective series (2X-50X)
- M42/M52 camera adapters
- Magnification reducer system
- Critical/Köhler illumination modules
- White/Blue LED light sources
- Compensator kit
- Rotating specimen stage
The PLM100 series features a modular design that can be flexibly configured according to specific analysis requirements
PLM100 System Advantages
Professional polarized light microscopy technology revealing material anisotropic characteristics
Crystal Structure Analysis
Accurately identify mineral crystal types, analyze crystal optical properties, providing reliable data for geological research.
Stress Birefringence Detection
Non-destructive detection of internal stress distribution in materials, achieving stress visualization through photoelastic effects.
Fiber Material Identification
Accurately identify natural and synthetic fibers, assess fiber orientation, supporting textile quality control.
High Extinction Ratio Design
Professional polarizing objectives eliminate internal stress interference, ensuring polarized imaging quality and measurement accuracy.
No Sample Treatment Required
Directly observe material intrinsic optical properties without staining or special preparation, maintaining sample original state.
Quantitative Analysis Capability
Combined with compensators for optical path difference measurements, enabling quantitative analysis of material thickness and birefringence.