DIC100 Series Differential Interference Contrast Microscopy System
Product Introduction
The DIC (Differential Interference Contrast) microscopy system utilizes the principle of dual-beam polarization interference, with the following process:
1. Linearly polarized light from the polarizer passes through a birefringent Nomarski prism, decomposing into two perpendicularly vibrating polarized beams with a certain phase difference;
2. The two non-coherent beams illuminate the sample, where minute surface irregularities or refractive index differences in the field of view create optical path differences. The two beams are reflected by the sample and recombine through the Nomarski prism;
3. The combined light passes through the analyzer, aligning their vibration directions to cause interference;
4. Sample details become enhanced with bright-dark contrast due to beam interference and amplitude changes, while sample detail images present a three-dimensional relief effect.
The Nomarski prism can be horizontally adjusted, functioning similarly to a phase-shifting compensator, changing the brightness and interference colors between objects and background in the field of view to achieve optimal observation results. Figure 1 shows the DIC100 Series differential interference contrast microscopy system.
Product Features
- Standard/Long working distance objective series (optional)
- Imaging optical path: 1X (tube lens focal length 180 mm), customizable with different magnification reducers
- Imaging path image field size: 25 mm
- Imaging path spectral range: Visible light
- Camera interface: C/M42/M52 optional
- Illumination method: Critical/Köhler illumination optional
- Illumination source: 10 W white/blue LED illumination optional
System Configuration and Parameters
Professional differential interference contrast microscopy system providing excellent imaging solutions for transparent samples
System Operating Principle
The DIC (Differential Interference Contrast) microscopy system utilizes the principle of dual-beam polarization interference to achieve high-contrast imaging
Beam Decomposition
Linearly polarized light passes through the Nomarski prism, decomposing into two perpendicularly vibrating polarized beams with a certain phase difference
Sample Interaction
The two non-coherent beams illuminate the sample, creating optical path differences due to minute surface irregularities or refractive index variations
Beam Recombination and Interference
The two beams, after reflection from the sample, recombine through the Nomarski prism and pass through the analyzer, aligning their vibration directions to cause interference
Contrast Enhancement
Sample details become enhanced with bright-dark contrast due to beam interference and amplitude changes, presenting a three-dimensional relief effect
Objective Series Parameters
Standard Working Distance Objective Series (60 mm parfocal distance, 200 mm tube lens focal length )
| Model | Magnification | NA | Working Distance | Focal Length | Resolution | Object Field | Image Field |
|---|---|---|---|---|---|---|---|
| DIC2.5XA | 2.5X | 0.075 | 6.2 mm | 80 mm | 4.46 µm | 10 mm | 25 mm |
| DIC5XA | 5X | 0.15 | 23.5 mm | 39 mm | 2.2 µm | 5 mm | 25 mm |
| DIC10XA | 10X | 0.3 | 22.8 mm | 20 mm | 1.1 µm | 2.5 mm | 25 mm |
| DIC20XA | 20X | 0.4 | 19.2 mm | 10 mm | 0.8 µm | 1.1 mm | 25 mm |
| DIC50XA | 50X | 0.55 | 11 mm | 4 mm | 0.6 µm | 0.44 mm | 25 mm |
Long Working Distance Objective Series (95 mm parfocal distance, 200 mm tube lens focal length )
| Model | Magnification | NA | Working Distance | Focal Length | Resolution | Object Field | Image Field |
|---|---|---|---|---|---|---|---|
| DICL2XA | 2X | 0.055 | 33.7 mm | 100 mm | 6.1 µm | 12.5 mm | 25 mm |
| DICL5XA | 5X | 0.14 | 33.6 mm | 40 mm | 2.2 µm | 5 mm | 25 mm |
| DICL10XA | 10X | 0.28 | 33.4 mm | 20 mm | 1.2 µm | 2.5 mm | 25 mm |
| DICL20XA | 20X | 0.34 | 29.5 mm | 10 mm | 0.8 µm | 1.25 mm | 25 mm |
| DICL50XA | 50X | 0.5 | 18.9 mm | 4 mm | 0.7 µm | 0.5 mm | 25 mm |
System Technical Specifications
Optical System
- Imaging Path
- 1X (tube lens focal length 180 mm), customizable with different magnification reducers
- Image Size
- 25 mm
- Spectral Range
- Visible light
- Tube Lens Focal
- 200 mm
Illumination System
- Illumination
- Critical/Köhler illumination optional
- Light Source
- 10 W LED
Mechanical System
- Camera Interface
- C/M42/M52 optional
- Objective Thread
- M26×0.705
- Prism Adjustment
- Precision horizontal adjustment
Typical Application Cases
Successful applications of DIC100 system in various fields
Conductive Particle Detection in LCD/OLED Products
The number of conductive particles in LCD circuit lines is critical for determining their conductive performance. Insufficient conductive particles reduce the circuit's conductive performance, potentially causing LCD display failures; excessive particles waste materials. The DIC100 system clearly observes conductive particle contours, accurately counts and analyzes particle distribution, avoiding the impact of agglomerated particles on counting.
- Clear visibility of conductive particle contours
- Accurate identification and counting of agglomerated particles
- Improved detection accuracy
- Blue LED illumination with monochrome camera for optimal contrast
- White LED illumination with color camera for natural colors
Surface Crack and Defect Detection
As one of the powerful detection and analysis methods in modern metallographic inspection, differential interference contrast microscopy has relatively low requirements for sample preparation, providing obvious relief perception under the microscope. It easily observes fine structures or defects that are invisible or barely visible in incident light bright field with conventional metallographic microscopes.
- Observation of particles, cavities, cracks, and uneven surface contours
- Lower requirements for sample preparation
- Provides obvious three-dimensional relief effect
- Makes material analysis more reliable
More Application Fields
Microbial Cell Detection
The DIC100 Series enables non-invasive live cell observation, producing images with different interference colors through optical staining effects. By adjusting focal distance, clear images of different layers can be obtained, with high resolution clearly showing intracellular contour structures.
- Non-invasive live cell observation
- Multi-layer clear imaging
- Clear visibility of intracellular contour structures
Comparison with Other Microscopy Techniques
| Comparison Technology | DIC Technology Advantages |
|---|---|
| Conventional Metallographic Microscopy | DIC can observe fine structures and defects that are invisible or barely visible in bright field with metallographic microscopes |
| Biological Microscopy | DIC provides better contrast and three-dimensional perception, observing transparent samples without staining |
| Phase Contrast Microscopy | DIC has no halo effect, higher resolution, and clearer images |
| Fluorescence Microscopy | DIC requires no staining, enables live observation, and avoids phototoxicity and photobleaching |
System Configuration and Accessories
Standard Configuration
- DIC100 main system
- Nomarski prism module
- Polarizer
- Analyzer
- 10 W LED illumination system
- Standard C-mount adapter
Optional Accessories
- Standard working distance objective series (2.5X-50X)
- Long working distance objective series (2X-50X)
- M42/M52 camera adapters
- Magnification reducer system
- Critical/Köhler illumination modules
- White/Blue LED light sources
The DIC100 Series features modular design, allowing flexible configuration based on specific application requirements
DIC100 System Advantages
Professional differential interference contrast technology providing excellent imaging effects
Superior Contrast Enhancement
Through dual-beam interference technology, phase differences are converted to amplitude differences, making minute details of transparent samples clearly visible.
Three-Dimensional Imaging
Unique relief effect presents sample surface morphology with three-dimensional appearance, facilitating observation and analysis of minute structures.
Flexible System Configuration
Standard/long working distance objectives optional, adapting to different samples and application requirements, meeting diverse inspection needs.
Precision Adjustment System
Nomarski prism horizontal precision adjustment achieves optimal interference effects and image quality.
Non-Invasive Living Cell Observation
Observe living cells without staining, avoiding phototoxicity and photobleaching, preserving sample viability.
High-Resolution Imaging
No halo effect, resolution superior to phase contrast microscopy, providing clearer image details.