BMM100 Series Brightfield Metallographic Microscopy System
Product Introduction
The Brightfield Metallographic Microscope consists primarily of three major systems: illumination system, imaging system, and mechanical system. It is a precision optical instrument widely used in various fields of modern science and technology, serving as a crucial inspection tool. Particularly in departments such as biology, geology, mineralogy, and medicine, metallographic microscopes play an increasingly important role.
Product Features
- Precision integrated design of three major systems (illumination, imaging, mechanical)
- Standard working distance objective series (60 mm parfocal distance)
- Long working distance objective series (95 mm parfocal distance)
- Critical/Köhler illumination dual-mode option
- 10 W high-brightness LED illumination system
- 25 mm large image field size design
- Multiple camera interface adaptations (C/M42/M52)
- White/Blue LED light source options
System Configuration and Parameters
Professional brightfield metallographic microscopy system providing precise imaging solutions for material inspection
System Operating Principle
The BMM100 Series brightfield metallographic microscopy system employs reflected brightfield illumination technology, achieving high-quality imaging of material microstructures through precision optical design
Illumination System
Provides uniform and stable epi-illumination, supporting both critical and Köhler illumination modes to ensure optimal illumination effects on sample surfaces
Imaging System
Utilizes high-quality optical elements and optimized optical path design, combined with professional objectives to achieve high-resolution, high-contrast imaging
Mechanical System
Precision mechanical structure ensures system stability and repeatable positioning accuracy, supporting extended continuous observation and inspection
Objective Series Parameters
Standard Working Distance Objective Series (60 mm parfocal distance, 200 mm tube lens focal length )
| Model | Magnification | NA | Working Distance | Focal Length | Resolution | Object Field | Image Field |
|---|---|---|---|---|---|---|---|
| BF5XA | 5X | 0.15 | 22 mm | 36 mm | 2.23 µm | 5 mm | 25 mm |
| BF10XA | 10X | 0.3 | 15 mm | 18 mm | 1.1 µm | 2.5 mm | 25 mm |
| BF20XA | 20X | 0.4 | 10 mm | 9 mm | 0.75 µm | 1.25 mm | 25 mm |
| BF50XA | 50X | 0.8 | 2.5 mm | 3.6 mm | 0.41 µm | 0.5 mm | 25 mm |
Long Working Distance Objective Series (95 mm parfocal distance, 200 mm tube lens focal length )
| Model | Magnification | NA | Working Distance | Focal Length | Resolution | Object Field | Image Field |
|---|---|---|---|---|---|---|---|
| BFL2.5XA | 2.5X | 0.075 | 6.2 mm | 80 mm | 4.46 µm | 10 mm | 25 mm |
| BFL5XA | 5X | 0.15 | 23.5 mm | 40 mm | 2.2 µm | 5 mm | 25 mm |
| BFL10XA | 10X | 0.3 | 22.8 mm | 20 mm | 1.1 µm | 2.5 mm | 25 mm |
| BFL20XA | 20X | 0.4 | 19.2 mm | 10 mm | 0.8 µm | 1.1 mm | 25 mm |
| BFL50XA | 50X | 0.55 | 11 mm | 4 mm | 0.6 µm | 0.44 mm | 25 mm |
System Technical Specifications
Optical System
- Imaging Path
- 1X (tube lens focal length 180 mm), customizable with different magnification reducers
- Image Size
- 25 mm
- Spectral Range
- Visible light
- Tube Lens Focal
- 200 mm
Illumination System
- Illumination
- Critical/Köhler illumination optional
- Light Source
- 10 W LED
- Light Options
- White LED/Blue LED optional
Mechanical System
- Camera Interface
- C/M42/M52 optional
- Objective Thread
- M26×0.705
- Focusing
- Precision focusing system
Typical Application Cases
Professional applications of BMM100 system in various fields
Metal and Alloy Material Inspection
The BMM100 Series plays a crucial role in microstructure analysis of metal materials and alloys, enabling clear observation of metal grains, phase structures, inclusions, defects, and other microscopic features, providing reliable basis for material performance evaluation and quality control.
- High-resolution observation of metal grain structures
- Accurate identification of phase structures and inclusions
- Clear display of material surface defects
- Support for quantitative metallographic structure analysis
- Applicable to various metals and alloy materials
LCD Display Screen Inspection
The system is used in LCD display screen manufacturing processes to inspect pixel structures, line connections, conductive particle distribution, and other key quality indicators, ensuring display quality and reliability.
- Clear observation of LCD pixel structures
- Precise detection of line connection quality
- Evaluation of conductive particle distribution uniformity
- Identification of display defects and anomalies
- Support for automated inspection integration
More Application Fields
Non-metallic Material Inspection
The BMM100 Series is equally suitable for surface morphology and internal structure observation of non-metallic materials such as plastics, ceramics, and composites, providing important support for material research and quality control.
- Observation of plastic material surface texture
- Detection of fiber distribution in composite materials
- Analysis of ceramic material grain structure
Geological and Mineral Analysis
In geology and mineral research, the BMM100 Series is used for mineral identification, rock structure analysis, and ore grade assessment, serving as an important tool for geological exploration and mineral development.
- Accurate mineral composition identification
- Rock microstructure analysis
- Ore grade assessment
Biomedical Research
The system is used in biomedical fields for tissue section observation, cell morphology analysis, and pathological diagnosis, providing precise microscopic images for medical research and clinical diagnosis.
- High-clarity tissue section imaging
- Accurate cell morphology observation
- Support for pathological diagnostic analysis
Comparative Advantages Over Other Microscopy Techniques
| Comparison Technology | BMM100 System Advantages |
|---|---|
| Darkfield Microscopy | The BMM100 brightfield system provides more realistic color reproduction and higher image contrast, suitable for most routine material inspections |
| Polarizing Microscopy | The BMM100 system is simpler to operate, requires no special sample preparation, and has wider applicability |
| Fluorescence Microscopy | The BMM100 requires no fluorescent labeling, can directly observe intrinsic material properties, with lower costs |
| Electron Microscopy | The BMM100 system is easy to operate, requires no vacuum environment, can observe live samples, with low maintenance costs |
System Configuration and Accessories
Standard Configuration
- BMM100 main system
- 10 W LED illumination system
- Precision focusing mechanism
- Standard C-mount adapter
- Anti-vibration base
Optional Accessories
- Standard working distance objective series (5X-50X)
- Long working distance objective series (2X-50X)
- M42/M52 camera adapters
- Magnification reducer system (0.5X/0.63X/0.75X)
- Critical/Köhler illumination modules
- White/Blue LED light sources
- Sample holding devices
- Dust cover
The BMM100 Series features modular design, allowing flexible configuration based on specific inspection requirements
BMM100 System Advantages
Professional brightfield metallographic microscopy technology providing precise material inspection solutions
High-Precision Imaging System
Optimized optical design and high-quality optical elements ensure clear and sharp images with authentic color reproduction.
Wide Application Range
Suitable for inspection of metals, alloys, plastics, ceramics, and various other materials, meeting quality control requirements across industries.
Modular Design
Flexible configuration options allow selection of objectives, illumination methods, and camera interfaces according to requirements, facilitating upgrades and maintenance.
LED Cold Light Source
10 W high-power LED illumination with low heat generation and long service life, providing stable and uniform lighting effects.
Stable Mechanical Structure
Precision focusing mechanism and anti-vibration design ensure long-term precision and image stability.
Easy Operation
No special sample preparation required, intuitive operating interface for quick mastery, improving inspection efficiency.